Sophion webinar recording: Simplifying organelle electrophysiology with ready-to-use Oria organelles and Sophion automated patch clamp technology
Last week, guest speakers Alexandre Santinho and Bastien Masson from Oria Bioscience, together with Sophion’s Eliška Waloschková, and hosted by Sophion’s Damian Bell, led a webinar highlighting how automated patch clamp technology is transforming organelle research with ready-to-use organelles.
Alexandre Santinho opened the webinar by sharing Oria Bioscience’s journey and key milestones in developing its organellar isolation technologies. He highlighted the advantages of using ready-to-use organelles over conventional isolation kits and provided practical examples of how these organelles accelerate experimental workflows and improve reproducibility.
Bastien Masson then shared insights from working with Oria’s lysosomes and other organelles. He explained how reducing preparation time and variability can lead to better seal formation, faster experimental setup, improved stability, and higher success rates in organelle patch-clamp experiments.
Eliška Waloschková concluded the webinar with a walkthrough of how to combine Oria’s ready-to-use organelles with Sophion’s automated patch-clamp platforms to achieve consistent, high-quality recordings. Using optimized consumables, researchers can perform high-resistance electrophysiology on organelles and small cells with greater reliability and efficiency on Sophion systems.
In this webinar, attendees learned how to perform organelle patch clamp faster, more reliably, and with fewer failed experiments – using tools that actually work together. Discover how combining Oria’s ready-to-use organelles with Sophion’s automated patch-clamp platforms can remove preparation bottlenecks, reduce variability, and deliver high-quality organelle data with your experiments.
Click below to watch the webinar and gain actionable guidance to optimize your patch-clamp workflows, practical strategies to improve assay reliability with ready-to-use organelles, and expert tips to avoid common technical pitfalls.